Highly Accelerated Life Testing (HALT)



Diagnosing a HALT Failure on sub module.

Highly Accelerated Life Testing (H.A.L.T.) is performed to uncover latent defects in product design, component selection and/or manufacturing that may otherwise go undetected through conventional qualification methods. The process subjects the test product to progressively higher stress levels, incorporating thermal dwells, rapid temperature transitions, vibration and a combination of temperature and vibration to precipitate inherent defects.

JCM provides technical resources for:

• Highly Accelerated Life Testing (HALT)
• Highly Accelerated Stress Screen (HASS)
• Highly Accelerated Stress Audit (HASA)
• Reliabilty Demonstration Testing (RDT)

 
MTBF Calculations; MIL-SPEC and TELCORDIA.